CdS thin film deposition by CW Nd:YAG laser

Abstract We report cumulative results on CW Nd:YAG laser deposition of CdS thin films. Films are characterized by X-ray diffraction, scanning electron microscopy, energy dispersive X-ray analysis, transmission electron microscopy, ultraviolet through visible light transmission, and Raman measurements. Films deposited at 400 °C or higher manifest a pure hexagonal CdS phase, and films deposited at 200 °C or lower contain both cubic and hexagonal phases.