Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast
1998
We report a hybrid microscope composed of an apertureless scanning
near-field optical microscope and a commercial atomic force
microscope. We discuss the optical origin of the near-field images
of a test sample. We show that the optical images have a sharp
contrast that depends on the illumination parameters: the state of
polarization and the angle of incidence of the incident
light.
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