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Analysis of layered semiconductor by synchrotron soft x-ray XAFS
Analysis of layered semiconductor by synchrotron soft x-ray XAFS
2009
A. Nambu
Kazuhiro Ueda
Masaki Yamada
Masahiro Takahashi
Keywords:
Nuclear magnetic resonance
X-ray absorption fine structure
X-ray
Semiconductor
Synchrotron
Materials science
soft x ray
Optoelectronics
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