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Reliability of Improved CAAC-IGZO FET Satisfying NOSRAM Performance
Reliability of Improved CAAC-IGZO FET Satisfying NOSRAM Performance
2015
Tsutomu Murakawa
Kazuaki Ohshima
Masashi Tsubuku
Daigo Shimada
N. Kamata
Tetsuhiro Tanaka
A. Shimomura
Masayuki Sakakura
Yoshitaka Yamamoto
Shunpei Yamazaki
Keywords:
Optoelectronics
Materials science
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