Enhancing Electrochemical Performance of V2O5 Thin Film by using Ultrasonic Weltering

A vanadium pentoxide (V2O5) thin films were deposited cathodically on stainless steel substrate (SS304) using aqueous vanadium tri-chloride (VCl3) as source of vanadium. Morphological, structural, physical properties were studied using SEM, XRD and contact angle test. Morphological study revealed that there is decrease in diameter and increase in depth of micro-pores which tends to increase in specific area of the film and thus enhancement in electrochemical performance. Eventually due to ultrasonic weltering V2O5 thin film became more viable as electrode in supercapacitor. Also retention of micro-pores facilitated effective electrolytic transport. The specific capacitance estimated for film before ultrasonic weltering was 333 F/g and it had been increased to 397 F/g after ultrasonic weltering.