Characteristics of thin film probe with temperature compensation

Abstract Analytical and experimental studies were carried out using an electrolytic technique to measure the thickness of a thin liquid film. It was found that the relationship between the thickness and the output voltage depends strongly on the area and the configuration of the probe. For a specific configuration and area of the probe, the output voltage depends on both the thickness and the temperature of the liquid. In order to achieve the output voltage as a unique function of the film thickness, the automatic temperature compensation method was applied. Comparisons were also made with analytical solutions. Good agreement was obtained.