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Device simulation for mechanical stress effects under parasitic bipolar region of SOI-MOS device.
Device simulation for mechanical stress effects under parasitic bipolar region of SOI-MOS device.
2019
Koki Shiotsuka
Kazuya Hidaka
Masaaki Koganemaru
Satoshi Matsumoto
Toru Ikeda
Noriyuki Miyazaki
Keywords:
Optoelectronics
Materials science
Stress (mechanics)
Silicon on insulator
device simulation
Correction
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