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Characterising the strain in a twisted nanowire by scanning electron diffraction
Characterising the strain in a twisted nanowire by scanning electron diffraction
2018
Alexander S. Eggeman
D. Ugarte
M. A. Cotta
Luiz H. G. Tizei
Caterina Ducati
Paul A. Midgley
Keywords:
Scanning electron microscope
Crystallography
Nanowire
Chemistry
Diffraction
Strain (chemistry)
Correction
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