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Local detection of X-ray spectroscopies with an in-situ AFM
Local detection of X-ray spectroscopies with an in-situ AFM
2008
Mario S. Rodrigues
Simon Le Denmat
Fabio Comin
Roberto Felici
Joël Chevrier
O. Dhez
Keywords:
Analytical chemistry
Scanning probe microscopy
In situ
Synchrotron radiation
Atomic force microscopy
Materials science
X-ray
X-ray spectroscopy
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