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Total reflection inelastic x-ray scattering from a 10 nm thick La{sub 0.6}Sr{sub 0.2}CoO thin film.
Total reflection inelastic x-ray scattering from a 10 nm thick La{sub 0.6}Sr{sub 0.2}CoO thin film.
2011
Timothy T. Fister
Dillon D. Fong
J. A. Eastman
Hakim Iddir
Peter Zapol
P. H. Fuoss
Manjula Balasubramanian
Robert A. Gordon
Kavaipatti R. Balasubramaniam
Paul A. Salvador
Keywords:
Thin film
Atomic physics
Momentum transfer
Scattering
X-ray reflectivity
X-ray
Total internal reflection
Physics
Electronic structure
Correction
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