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Scanning reflection electron microscopy study of ultrathin Al_2O_3/Si(001) interfaces
Scanning reflection electron microscopy study of ultrathin Al_2O_3/Si(001) interfaces
2001
Manisha Kundu
Noriyuki Miyata
Masakazu Ichikawa
Keywords:
X-ray photoelectron spectroscopy
Polymer characterization
Layer by layer
Analytical chemistry
Electron microscope
Crystallography
Materials science
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