Mid‐infrared detectors based on carbon nanotube films

In this paper we report the fabrication and characterization of single wall carbon nanotube film based devices. Carbon nanotubes (CNT) film is deposited on a silica substrate and usual clean room processes have been used to make Pt-electrodes on top of it and to pattern the CNT film. The obtained devices have been used to measure the evolution of the temperature coefficient of resistance (TCR) as a function of temperature. At room temperature the TCR is –0.2%K-1 and becomes even more important as the temperature goes down. Moreover the optical response in atmospheric band II and band III have been investigated at room temperature showing a variation of the device resistance up to 0.2% for an irradiance of ∼100 mW/cm2 in the 3–5 µm range. Such results are very promising for application of CNT films in bolometers for thermal infrared detection (© 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)