Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS

Herein we show characterization of an Fe thin film on Al2O3 after thermal annealing under H2 using Al Kα x-rays. The XPS survey spectrum, Fe 2p and O 1s narrow scans, and valence band regions are presented. The survey spectrum shows aluminum signals due to exposure of the underlying Al2O3 film during Fe nanoparticle formation.