Formation of GaN nanorods by a sublimation method

Abstract GaN nanorods with diameters of 10–45 nm were formed through a simple sublimation method. They were characterized by X-ray powder diffraction (XRD), scanning electron microscopy (SEM), selected area electron diffraction (SAED) and high-resolution transmission electron microscopy (HRTEM). SEM images showed that the nanorods were straight. XRD, SAED and HRTEM indicated that the nanorods were wurtzite GaN single crystals.