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LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems
LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems
2012
Udipi
Muralimanohar
Balsubramonian
Davis
Jouppi
Keywords:
Embedded system
memory systems
parallel processing
Commodity (Marxism)
Computer science
Reliability (statistics)
Fault tolerance
Correction
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