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Extended data retention characteristics after more than 10/sup 4/ write and erase cycles in EEPROMs
Extended data retention characteristics after more than 10/sup 4/ write and erase cycles in EEPROMs
1990
Aritome
Kirisawa
Endoh
Nakayama
Shirota
Sakui
Ohuchi
Masuoka
Keywords:
Data retention
Reliability (statistics)
EPROM
life testing
Reliability engineering
Computer science
integrated circuit fabrication
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