TID Impact on SEL Sensitivity in the Case of High Latchup Holding Voltage

Alexander A. Novikov,I. I. Shvetsov-Shilovskiy,E. N. Oblova,Alexander A. Pechenkin,Alexander I. Chumakov

TID Impact on SEL Sensitivity in the Case of High Latchup Holding Voltage

2021

Alexander A. Novikov
I. I. Shvetsov-Shilovskiy
E. N. Oblova
Alexander A. Pechenkin
Alexander I. Chumakov

In an Integrated Circuit with high SEL holding voltage, pulsed-laser radiation sensitivity was found to change due to TID irradiation. The impact of TID on the DUT SEL holding voltage and SEL sensitivity was investigated.

Keywords:

Integrated circuit
Optoelectronics
Irradiation
sensitivity
Radiation sensitivity
Voltage
Microelectronics
Materials science

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