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Surface Charge Distribution on Hydrogen-Passivated Silicon Measured by UHV Kelvin Probe Microscopy
Surface Charge Distribution on Hydrogen-Passivated Silicon Measured by UHV Kelvin Probe Microscopy
2012
Pavel Nagornykh
Kristen M. Burson
William G. Cullen
B. E. Kane
Keywords:
Analytical chemistry
Kelvin probe force microscope
Hydrogen
Chemistry
Silicon
Surface charge
Materials science
Optoelectronics
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