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Investigation of internal amplification effect at planar structures made from p-silicon
Investigation of internal amplification effect at planar structures made from p-silicon
2006
O. F. Vikhlyantsev
S. Golubkov
N. Egorov
Y. Kozlov
K. A. Konkov
V.S. Pantuev
A. I. Sidorov
Yu. B. Gurov
K. N. Gusev
N. I. Zamyatin
V.G. Sandukovskij
A. S. Starostin
J. Yurkowski
Keywords:
Particle detector
Optoelectronics
Calibration
Semiconductor detector
Measuring instrument
Planar
Silicon
Materials science
semiconductor materials
Correction
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