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Elemental Characterization of the Topmost Atomic Layer of Surface Using Doppler Broadening Spectroscopy
Elemental Characterization of the Topmost Atomic Layer of Surface Using Doppler Broadening Spectroscopy
2020
Alex Weiss
V A Chirayath
R W Gladen
A J Fairchild
Philip A. Sterne
S. Lotfimarangloo
E. Perez
Ali R. Koymen
Keywords:
Physics
Condensed matter physics
Spectroscopy
Atomic physics
Doppler broadening
Correction
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