X-ray diffraction intensity change occuring intercalation process of nickel hydroxide into the interlayer space of montmorillonite.

1990 
The X-ray diffraction intensity corresponding to the basal plane reflections, from (001) to (005), for nickel intercalated montmorillonite was measured as a function of nickel content. The intensity of these five lines changed systematically as the nickel content increased. On the other hand, the composition-dependence of the line intensity was theoretically calculated on the basis of the structure model that nickel hydroxide monolayar fills gradually in the interlayer space of montmorillonite on the various steps of intercalation reaction. The experimental results were found to be consistent with the calculated intensity. However, some differences were also found, which was discussed in terms of adsorption site difference of nickelions.
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