Analysis of a x-cut Ti:LiNbO/sub 3/ electrooptic modulator with a ridge structure

An analysis of a Ti:LiNbO/sub 3/ Mach-Zehnder traveling-wave electrooptic modulator with a ridge structure is presented in this work. The performance of the device is studied assuming x-cut substrate. Two configurations employing ridge structure are compared to a conventional one. This work also presents the influence of some fabrication parameters of the optical waveguide on the factors which evaluates the efficiency of the modulators. The characteristics of both the optical waveguide and the coplanar waveguide electrode are computed applying the scalar finite element method.