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GaAs:Cr X-ray sensors noise characteristics investigation by means of amplitude spectrum analysis
GaAs:Cr X-ray sensors noise characteristics investigation by means of amplitude spectrum analysis
2018
I. Chsherbakov
I. Kolesnikova
A. Lozinskaya
T. Mihaylov
V. A. Novikov
A. Shemeryankina
O. P. Tolbanov
A. V. Tyazhev
A. Zarubin
Keywords:
Physics
Optics
Frequency spectrum
X-ray
Correction
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