Sampling-free analysis of chemical compounds using a static Fourier-transform spectrometer

We have considered a technique for noncontact analysis of compounds and a device for its realization. To construct the device, we have proposed a static Fourier-transform spectrometer that is based on the phenomenon of interference in a wedge. A procedure for obtaining and processing emission spectra has been described. Interference patterns are recorded using sources of excitation radiation of 280 and 315 nm. Basic characteristics of the optical system have been calculated, and emission spectra of test objects have been presented.