Probing the Density Variation of Confined Polymer Thin Films via Simple Model-Independent Nanoparticle Adsorption

After more than 2 decades of intense research, the density variation in confined polymer films still remains a puzzling problem subject to controversy as the methods utilized to determine the density are often model dependent. Here, we propose a direct and model independent method to detect the density/refractive index variations in polymer thin films through the adsorption of ceria nanoparticles (NPs) onto their surface. The amount of adsorbed NP scales with the polymer film refractive index; hence, any increase/decrease in the NP surface coverage directly indicates an increase/decrease in the film refractive index and density. Experimenting our proposed novel approach on two well-studied polymers, we found that the density of polystyrene (PS) thin films deposited on oxide-free Si substrate increases with a reduction of the film thickness. On the contrary, poly(methyl methacrylate) (PMMA) films deposited on wafers with native silicon oxide show a decrease of their density when the film thickness is reduced.