Study of structures and dielectric dispersion behavior of BaTiO3/YBa2Cu3O7−x bilayer films

Abstract The structures of BaTiO 3 /YBa 2 Cu 3 O 7−x bilayer films and their low frequency dielectric dispersion behavior were investigated. With the increase of BaTiO 3 film thickness, the crystallinity of the BaTiO 3 films gets better and the c-axis lattice constants become smaller. It is shown that the ion-vacancy migration, related to film structures, film defects and boundaries, plays an important role in the low frequency dielectric dispersion behavior.