Cryogenic Characterization of the FBK NUV-HD SiPMs

We report on the characterization of the NUV-HD SiPMs developed at FBK at cryogenic temperature. A dedicated setup was built to measure the primary dark noise and correlated noises of the SiPMs between 40 and 300 K. Moreover a specific analysis program in conjunction with an ad-hoc data acquisition system were developed to allow the precise characterization of these parameters, some of which can vary up to 7 orders of magnitude between room temperature and 40 K. We proved that it is possible to operate the FBK NUV-HD SiPMs at temperatures lower than 100 K with a dark noise below 0.01 cps/mm$^2$ and total correlated noise below 35% at 6 V of over-voltage. These results are relevant for the development of future cryogenic particle detector based with SiPMs as photosensors.