Investigation of single-crystals of chromium implanted with 119Sn-ions of various energies

Abstract Single-crystals of chromium doped with 10 16 119 Sn ions per cm 2 and energies ranging between 45 and 190 keV were investigated with conversion electron Mossbauer spectroscopy (CEMS), Auger electron spectroscopy (AES), grazing angle X-ray diffraction (GAXRD), and scanning electron microscopy (SEM). The Mossbauer spectra were found to be significantly different than those of the bulk. Both the maximum and the average hf. field values were higher by a factor of ∼3 than the corresponding quantities for the bulk. The overall shape of the spectra is also different. GAXRD study has revealed that the near-surface zone of the investigated samples has a nanocrystalline structure with the average size of grains ranging between ∼20 and ∼40 nm. The latter seems to be the main reason for the observed enhancement of the spin-density and its distortion.