Statistical modelling for integrated circuits

This contribution attempts to survey two alternative approaches to the characterisation of ICs for statistical design. The first is based on a direct description of the distributions of the electrical parameters of standard device models, while the second approach starts from distributions of more fundamental processing variables, and will be dealt with in more detail. After considering ways to ensure that the circuit designer's distributions are up-to-date with the process, a structure is proposed for modelling the important matching effects found in an IC. Finally, conclusions for circuit design are drawn.