First-principles analysis of the STM image heights of styrene on Si(100)

K. H. Bevan,1,* F. Zahid,2 D. Kienle,3 and H. Guo2 1NSF Network for Computational Nanotechnology, Purdue University, West Lafayette, Indiana 47907, USA 2Centre for the Physics of Materials and Department of Physics, McGill University, Montreal PQ, Canada H3A 2T8 3Sandia National Laboratories, Livermore, California 94550, USA Received 30 January 2007; revised manuscript received 17 April 2007; published 23 July 2007