Chemical identification at atomic resolution on Cu(110)-O surface using NC-AFM

Scanning probe microscope (SPM)(including atomic force microscope (AFM), scanning tunneling microscope (STM) and Kelvin force probe microscope (KPFM)), etc.), tips have a great influence on physical and chemical properties of the sample surface. In this research, we explore the relationship between tip and structure of sample surface using AFM on Cu(110)-O surface. We observed two different types of c(6×2) phase on which Cu shows bright spot when the tip apex is O-terminated; on the other hand, O atoms shows bright spot when the tip apex is Cu-terminated. We also obtained that the tip has a great influence on the resolution, imaging, etc. Thus, we gave an explanation for both phenomena. This technique can be used for the fingerprinting and the identification of the chemical species on sample surfaces. And it is very important for the development of SPM technique.