Conductance of shock-compressed metal-insulator-metal structures based on polymethyl methacrylate

The problem of the conductance of shock-compressed metal-insulator-metal (MIM) film structures based on polymethyl methacrylate is solved by numerical and analytical methods. Analytical expressions are obtained for the conductance of a MIM structure impacted by solid particles moving with velocities exceeding 1 km/s and for the output voltage of a capacitor detector. The numerical and analytical calculations of the conductance (current pulse) of a shock-compressed structure are in qualitative agreement with one another.