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Invited) Characterization of Interfacial Dipoles at Dielectric Stacks by XPS Analysis
Invited) Characterization of Interfacial Dipoles at Dielectric Stacks by XPS Analysis
2017
Seiichi Miyazaki
Akio Ohta
Nobuyuki Fujimura
Keywords:
Dipole
Dielectric
X-ray photoelectron spectroscopy
Nuclear magnetic resonance
Materials science
Condensed matter physics
Analytical chemistry
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