X-ray diffraction studies on La1.85Sr0.15CuO4 doped with Mg in high doping level

Abstract The nominal composition of La 1.85 Sr 0.15 Cu 1−y Mg y O 4 superconductors with 0.00≤y0.30 are synthesized by the solid state reaction techniques. The structure of these Mg doped samples is characterized by X-ray diffraction studies. The atomic structure parameters are obtained by Rietveld refinements. Some meaningful bond distances are determined according to the refined results. The distance between the two apical oxygen atoms in the CuO 6 octahedra changed with the Mg content. The room temperature resistivity for each sample is measured.