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ON CERTAIN POTENTIAL IMPROVEMENTS IN THE METROLOGICAL TRACEABILITY OF LINEAR MEASUREMENTS IN THE NANOMETRIC RANGE NANOMETROLOGY
ON CERTAIN POTENTIAL IMPROVEMENTS IN THE METROLOGICAL TRACEABILITY OF LINEAR MEASUREMENTS IN THE NANOMETRIC RANGE NANOMETROLOGY
2009
A. G. Danelyan
D.I. Garibashvili
R. R. Kankiya
S. A. Mkrtychyan
S. V. Shotashvili
Keywords:
Optics
Metrology
Nanometrology
Mathematics
Traceability
Correction
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