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A Robust SOI SRAM Architecture by using Advanced ABC technology for 32nm node and beyond LSTP devices
A Robust SOI SRAM Architecture by using Advanced ABC technology for 32nm node and beyond LSTP devices
2007
Yuuichi Hirano
Mikio Tsujiuchi
K Ishikawa
Hisanori Shinohara
T. Terada
Yukio Maki
Toshiaki Iwamatsu
Katsumi Eikyu
T. Uchida
Shigeru Obayashi
Koji Nii
Yasumasa Tsukamoto
Makoto Yabuuchi
Takashi Ipposhi
Hiroshi Oda
Yasuo Inoue
Keywords:
Silicon on insulator
Static random-access memory
Electrical engineering
Threshold voltage
Architecture
Computer science
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