Positron Annihilation During Pre-crystallization Process in an Amorphous Silver Ionic Conductor

The study of positron annihilation on amorphous 0.60AgI-0.25Ag2O-0.15P2O5 has been carried out in the temperature range from 100 to 350 K. The temperature dependence of average lifetime shows anomalous peaks at 208, 228, 325, 338 K indicating possible structure relaxation. Especially the last two peaks reflect the structural changes during pre-crystallization process of the amorphous ionic conductor. These results are consistent with that of ultrasonic attenuation and ionic conductivity experiments on the same samples.