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Contactless measurement of carrier generation rate in semiconductors
Contactless measurement of carrier generation rate in semiconductors
1978
P. Thulsi Das
Richard T. Webster
H. Estrada-Vazquez
Keywords:
Lithium niobate
Electrical resistance and conductance
Dark current
Semiconductor device
Semiconductor
Electronic engineering
Nondestructive testing
Surface wave
Surface acoustic wave
Materials science
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