A high resolution wire scanner for micron-size profile measurements at the SLC

Abstract Fine conductive fibers have been used to measure transverse beam dimensions of a few microns at the Stanford Linear Collider (SLC). The beam profile is obtained by scanning a fiber across the beam in steps as small as 1 μm, and recording the secondary emission signal at each step, using a charge sensitive amplifier. We first outline the mechanical construction and the analogue electronics of the wire scanner. We then describe its performance in test beams and in actual operation. The article closes with a brief discussion of performance limitations of such a beam profile monitor.