Reliability Prediction of High Power Laser Diodes for Space Application Considering the Effect of Temperature Drift

Accelerated degradation test (ADT) as an element of reliability test is proposed to predict the reliability of High Power Laser Diodes. Temperature stress ADT is demonstrated for 8 High Power Laser Diodes which used in space missions, and both output power and internal resistance of High Power Laser Diodes are researched. Based on Geometric Brownian motion, the lifetime of tested High Power Laser Diodes is about 53667 hours when only considering luminous flux attenuate. However, when the temperature drift is considered as one evaluating factor, the lifetime estimated is about 107500 hours. Results show that for the evaluation of High Power Laser Diodes, both luminous flux degradation and temperature drift should be taken into consideration. It is proved that the lifetime of this kind High Power Laser Diodes meets requirement of space mission, which does not need to be set as orbit replacement unit.