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Proton-irradiation Effects on Charge Trapping-related Instability of Normally-off AlGaN/GaN Recessed MISHFETs
Proton-irradiation Effects on Charge Trapping-related Instability of Normally-off AlGaN/GaN Recessed MISHFETs
2019
Dongmin Keum
Hyungtak Kim
Keywords:
Electronic engineering
Optoelectronics
Computer science
Trapping
Irradiation
Proton
Instability
normally off
algan gan
Correction
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