Effect of Thermal Stress over High-Efficiency Solar Photovoltaic Modules in real operating condition

The hot spot phenomenon is a relatively frequent problem with solar photovoltaic modules (SPV). The module installations in the recent year are increasing due to different technical and commercial improvements; however, their inspection and maintenance requirements are likewise demanded. As the SPV technology installed on various residential and commercial buildings, safety issues are also the prime concern; it should neither damage the structures nor harm the residents. This paper undertakes a systematic compilation of a simple procedure to examine the faults in four solar module technologies, i.e., interdigitated back cell (i), hetero-junction intrinsic thin layer silicon (HIT), and multi-crystalline (mc-si) and mono-crystalline (m-si) silicon modules using infrared inspection. The infrared images are accepted up to 10 min to ensure the relevant results and thermal stress over modules. The distribution of the temperature was reported in the paper for all the four technologies, including two high-efficiency SPV modules.