Externally induced jumps in the magneto-fingerprints of nano-structures

Abstract The universal conductance fluctuations (UCF) of two wires (films with 200 × 19 nm 2 cross section and 2 μm length) are investigated in a bridge circuit. External voltage spikes are applied to the sample. They yield jumps and irreversible changes in the conductance. The standard deviation of the conductance jumps and the conductance are roughly the same. Magneto-fingerprints confirm the change in the distribution of the scattering centers. The correlation between succeeding magneto-fingerprints reduces after the occurence of conductance jumps.