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Transmission electron microscopy study of Ni suicides formed during metal-induced silicon growth
Transmission electron microscopy study of Ni suicides formed during metal-induced silicon growth
2001
Elena A. Guliants
Wayne A. Anderson
L.P. Guo
Vadim V. Guliants
Keywords:
Computer science
Nanotechnology
Astronomy
Transmission electron microscopy
Molecular physics
Silicon
Metal
Correction
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