Structural characterization of C60 nanowhiskers formed by the liquid/liquid interfacial precipitation method

The structure of C60 whiskers fabricated by using the liquid/liquid interfacial precipitation method is analysed with transmission electron microscopy (TEM). The C60 whiskers with submicrometre diameters, named ‘C60 nanowhiskers (C60NWs)’, contain (002)c planar faults, and the centre-to-centre distance between the C60 molecules along the growth axis of C60NWs is shortened ∼1% compared with that of pristine C60 crystals, indicating the formation of chemical bondings between the C60 molecules along [110]c ([100]t) close-packed directions of the C60NWs. The electrical resistivity of C60 whiskers decreased on decreasing their diameter. This result suggests that the C60NWs are electrically conductive. The C60 whiskers are very flexible and could form a semicircle with a curvature radius of 38 µm. Copyright © 2003 John Wiley & Sons, Ltd.