Optical Study of BaSm 2 Ti 4 O 12 by Vacuum Ultra Violet Spectroscopic Ellipsometry

We performed a study on optical properties of thin films by vacuum ultra violet spectroscopic ellipsometry in the energy range. For the analysis of the measured ellipsometric spectra, a 5-layer model was applied where optical property of the layer was well represented by a Tauc-Lorentz dispersion function. Our analysis clearly showed new structure in high energy region at about 7.5 eV Consistent changes of refractive index & extinction coefficient of the thin film by the growth and annealing temperatures were also confirmed.