Nanometer-scale mechanics of gold films.

1993 
Abstract : We have used interfacial force microscopy (IFM) to monitor the mechanical deformation of single nanometer-sized grains in Au thin films. Our results show that protruding grains, which represent early-stage delamination, display multiple deformation mechanisms including grain-boundary sliding and intragranular plasticity. The unprecedented load displacement control capability of the IFM provides data that is used for the first time to quantitatively distinguish and evaluate individual deformation processes.
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