Dose rate upset mechanism involving CMOS input protection circuitry
1985
A dose rate upset mechanism involving input protection circuitry has been discovered for a particular application of a CMOS integrated circuit. Features of the system application dominate the radiation response, and thus the hardness level, of the integrated circuit component. This upset mechanism illustrates the necessity to perform component testing under conditions closely approximating the system application in hardness assurance programs.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI