Modification of the photosensitive CCD structures for application in the spectrometric equipment

Problems of using most of the common CCD photodetectors in the optical spectrometers are described. Suppression of the interferential distortions of the spectral data by deposition of an additional transparent layer on a CCD surface is shown. Additional film with optical parameters close to silicon dioxide considerably reduces the effect of interference. Comparison of the radiation spectra of different sources before and after modification of the CCD structure is carried out.