Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nanocircuit at very low temperature

The authors demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60mK). This local probe uses a quartz tuning fork ensuring high tunnel junction stability. They performed the spatially resolved spectroscopic study of a superconducting nanocircuit patterned on an insulating substrate. Significant deviations from the theoretical prediction are observed.